|
RFID
Pro to Pro Forums
RFID Pro to Pro Forum: Issues, Questions, Answers and
Comments About RFID Standards, Applications and Technology
RFID
Pro to Pro Forums are designed for technology users, technology providers,
standards setters, consultants and educators who have a professional interest in
RFID. Forums enable people to meet in an open telephone conference call setting
to exchange ideas and information.
The RFID Pro to Pro Forums are hosted by InsightU, The
Center for AIDC at Ohio University and SCAN: The DATA CAPTURE Report (SCAN/DCR). These interactive and
convenient telephone conference forums are designed to provide timely, practical
information. Attendees are invited to ask questions, make comments and refer to
other information resources to make a point or to help others understand the
deeper meaning of an issue.
The
Fall 2004 Series of
RFID Pro to Pro Forums:
-
Monday,
September 20
(1:00 to 2:00 PM Eastern time) - Meet The
Press
- Have you ever wanted to learn the “story behind the story?”
-
Monday,
November 8
(2:00 to 3:00 PM Eastern time) -
Update
on RFID Based EPC: The Latest From The September Meeting And the Board Of
Governors Vote October 1
-
Monday,
December 6
(1:00 to 2:00 PM Eastern time) - Five
Problem Areas That Cause RFID Failures and Some Ways to Improve Them
Registration
is $49 per forum.
How the Forums Work
Forum
topics are related to the impact of RFID technology on the market, applications
and supply chains. Topics are selected from headlines in the news, and other
input from Rick Morgan, Editor of SCAN/DCR, Rick Bushnell of InsightU, Bruce
Philpot and Jim Fales, The Center for AIDC at Ohio University, as well as leading
experts who are using or producing the RFID or other related AIDC technology.
The Host
Moderator will introduce the featured professional who share information,
knowledge and their point of view to stimulate participation, questions and
comments from the forum attendees who dialed-in. The Host Moderator will
amplify points based on his or her own experience, field question and keep the
group on target. After the forum, participants are invited to email questions
and comments to InsightU to be posed at the RFID Forum web site or to contact
each other directly through the InsightU Professional Registry.
Moderators
Rick Morgan, Editor of SCAN/DCR, Rick Bushnell, President of Quad II and Founder
of InsightU, Bruce Philpot, Director of the Center of AIDC at Ohio University,
John Hill, President of ESYNC.
Featured Professionals
Ed Hess, Integrated Solutions Magazine, Karen Longe, Karen Longe Associates,
Steve Halliday, HighTech Aid, Mike Ohanian, Consultant (Former President of
Intermec)
Contact Forum
Attendees
After the forum,
participants are invited to email questions and comments to InsightU to be
posted
at the RFID Forum web site or to contact each other directly through the
InsightU Faculty
or Professional Registry.
The Fall 2004 Series of
RFID Pro to Pro Forums
Monday, September
20, 2004 -- 1:00 Eastern Time
RFID
Pro to Pro Forum - Meet The Press
Have
you ever wanted to learn the “story behind the story?” Or have you ever
wanted to ask an editor “Why don’t you cover this?” Rick Morgan, Editor
of SCAN/DCR and ED Hess Editor, Integrated Solutions Magazine will start
the discussion with their views on the following:
-
Standards
– Concerns and clarifications about EPC and other standard setting activities.
What is happening with EPC? There have been several reorganizations and there is
some concern about the overall direction and timing of implementation with DOD,
Wal-Mart and some other large potential users.
-
Technology-
Can the current and anticipated manufacturing yields of RFID devices provide a
level of supply that is acceptable to those who want to use RFID, large scale?
Is there a new breed of technology that addresses the yield and cost issue
better than current technology?
-
Applications
– What really is working today? Why are these applications successful? How
have technology providers met the demand placed on them by users?
The moderator will solicit
questions, answers and
comments from forum attendees.
Monday, November
8, 2004 -- 2:00 Eastern time
RFID
Pro to Pro Forum - Update on RFID Based EPC: The Latest From The
September Meeting And the Board Of Governors Vote October 1
Everyone
admits that staying on top of EPC is difficult (to say the least). A number of
changes were presented at the September 2004 meetings and voted on by the Board
of Governors in October. Steve Halliday, President of High Tech Aid will
lead the discussion with an update on the latest policy and direction statements
coming out of the meetings. With his years of involvement in EPC and other
standard setting activities Steve will help everyone understand the hard and
soft spots and what they mean to standards, technology and applications.
-
Standards
– The current and future scope of EPC standards
-
Technology
– How the technology providers are responding, and can, respond to EPC changes
-
Applications
– Where and how EPC is being used and what is over the horizon.
The moderator will solicit
questions, answers and
comments from forum attendees.
Monday, December,
6 2004 -- 1:00 Eastern time
RFID Pro to Pro Forum - Five
Problem Areas That Cause RFID Failures and Some Ways to Improve Them
Professionals like you
identify and solve problems. They don’t just point fingers.
Problem: People
implementing RFID systems are having problems. Wal-Mart, DoD, and others all
admit that.
Solution:
Whether you make chips, design, install or buy RFID systems, you should find out
the most important design and implementation questions to ask so you can be part
of the solution; not become part of the problem.
Mike Ohanian, now an
independent consultant, former president of Intermec and with a long history in
micro-electronics (Martin Marietta, Litton, Raytheon) will get you started on
the right path to truly functional RFID systems.
Mike will provide observations,
comments and action ideas dealing with Five Problem Areas That Cause RFID
Failures and Some Ways to Improve Them. The session will last about an
hour. Since it is a forum we invite questions during the presentation.
-
How to improve first read rates
-
Smart
labels/printers/applicators
-
Reader/Antenna mounting
-
Tag attachment/location
-
Testing methodology, QC,
failure analysis
Since
this is an interactive session, we must limit the audience to 30 people. Please
register at once so you can participate.
|
